RF-sputtered CoCr films have been characterized for
a variety of deposition conditions, and the most effective
parameters which bring about perpendicular anisotropy have
been evaluated. In particular bias sputtering has been
noted for its role in improving the crystallographic
orientation and magnetic properties when applied to the
substrate at certain values, hence the root mechanism of
the observed improvement has been, as far as possible ,
investigated . These investigations have, in particular,
focused on the extent to which impurity gases are likely to
effect the magnetic properties of sputtered films, as well
as quantifying the gas contents of the films using as yet
unexploited (in this area) method of thermal desorption
experiments.
In a further attempt to quantify tolerable level of
impurity species in the sputtering environment , impurity
gases of nitrogen, oxygen and hydrogen, which are commonly
present even in high vacuum systems, were intentionally
introduced in the sputtering chamber and their effects on
both magnetic and crystallographic properties of CoCr were
noted .
To measure the perpendicular and in-plane magnetic
properties of CoCr , a combined polar-transverse Kerr magneto-
optic system was costructed , through which direct magnetic
measurement of CoCr/NiFe becomes feasible . This method
was further exploited to compare volume and surface magnetic
properties of CoCr , as measured using a V.S.M and this
M-O system.
Finally , a CoCr/NiFe W1nchester disc was fabricated
on which a recording experiment was successfully
performed.
Date of Award | 1988 |
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Original language | English |
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Awarding Institution | |
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INVESTIGATION INTO PERPENDICULAR ANISOTROPY COBALT-CHROMIUM FILMS WITH APPLICATION TO WINCHESTER COMPUTER DISCS
MAHVAN, N. (Author). 1988
Student thesis: PhD