Towards accurate measurement of the frequency dependence of capacitance and resistance standards up to 10 MHz.

Shakil A. Awan*, Bryan P. Kibble

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)516-520
Number of pages0
JournalIEEE Trans. Instrum. Meas.
Volume54
Issue number0
DOIs
Publication statusPublished - 2005

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