Original language | English |
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Pages (from-to) | 516-520 |
Number of pages | 0 |
Journal | IEEE Trans. Instrum. Meas. |
Volume | 54 |
Issue number | 0 |
DOIs | |
Publication status | Published - 2005 |
Towards accurate measurement of the frequency dependence of capacitance and resistance standards up to 10 MHz.
Shakil A. Awan*, Bryan P. Kibble
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review