@inproceedings{362dadacf9164ec9b6695dbf3d46921d,
title = "Toward Precision Resistance Measurements by a Precision LCR Meter at Frequencies up to 2 MHz",
abstract = "We have investigated the lead effects of a 10-kΩ resistance standard measured by a precision LCR meter at frequencies up to 2 MHz. In the case of a two-terminal-pair configuration, we demonstrate that the effect of 2.5 m long measuring leads, which are inevitable for some special applications, can be precisely corrected. Other systematic effects of the LCR meter were also investigated. They are distinctly larger than the resolution of the LCR meter, but accurately reproducible. As such it should be possible to calibrate the LCR meter against a calculable high-frequency resistance standard with an uncertainty close to the few-parts-per-million resolution of the LCR meter.",
keywords = "Calculable resistor, high-frequency metrology, impedance standard, lead correction, precision LCR meter",
author = "J. Schurr and Awan, \{S. A.\}",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; Joint 2024 NCSL International Annual Workshop and Symposium / Conference on Precision Electromagnetic Measurements, CPEM 2024 ; Conference date: 06-07-2024 Through 12-07-2024",
year = "2024",
month = aug,
day = "30",
doi = "10.1109/CPEM61406.2024.10645980",
language = "English",
series = "CPEM Digest (Conference on Precision Electromagnetic Measurements)",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2024 Conference on Precision Electromagnetic Measurements, CPEM 2024 - Proceedings",
address = "United States",
}