Strain–energy method for determining residual stresses in anodised thin films

A. M. Cree*, S. V. Hainsworth, G. W. Weidmann

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)246-251
Number of pages0
JournalTransactions of the IMF
Volume84
Issue number5
DOIs
Publication statusPublished - Sept 2006

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