Recognition of Nanocomposites Agglomeration in Scanning Electron Microscopy Image with Semantic Segmentation Algorithm

Research output: Contribution to journal › Conference proceedings published in a journal › peer-review

Original language	English
Number of pages	0
Journal	2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Volume	0
Issue number	0
DOIs	https://doi.org/10.1109/ceidp49254.2020.9437466
Publication status	Published - 18 Oct 2020
Event	2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Duration: 18 Oct 2020 → 30 Oct 2020

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title = "Recognition of Nanocomposites Agglomeration in Scanning Electron Microscopy Image with Semantic Segmentation Algorithm",

author = "Y Bai and D Qiang and Y Zhang and X Wang and X Zhuang and G Chen and Y Wang",

year = "2020",

month = oct,

day = "18",

doi = "10.1109/ceidp49254.2020.9437466",

language = "English",

volume = "0",

journal = "2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)",

number = "0",

note = "2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) ; Conference date: 18-10-2020 Through 30-10-2020",

}

Recognition of Nanocomposites Agglomeration in Scanning Electron Microscopy Image with Semantic Segmentation Algorithm. / Bai, Y; Qiang, D; Zhang, Y et al.
In: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Vol. 0, No. 0, 18.10.2020.

Research output: Contribution to journal › Conference proceedings published in a journal › peer-review

TY - JOUR

T1 - Recognition of Nanocomposites Agglomeration in Scanning Electron Microscopy Image with Semantic Segmentation Algorithm

AU - Bai, Y

AU - Qiang, D

AU - Zhang, Y

AU - Wang, X

AU - Zhuang, X

AU - Chen, G

AU - Wang, Y

PY - 2020/10/18

Y1 - 2020/10/18

U2 - 10.1109/ceidp49254.2020.9437466

DO - 10.1109/ceidp49254.2020.9437466

M3 - Conference proceedings published in a journal

VL - 0

JO - 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

JF - 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

IS - 0

T2 - 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Y2 - 18 October 2020 through 30 October 2020

ER -