Recognition of Nanocomposites Agglomeration in Scanning Electron Microscopy Image with Semantic Segmentation Algorithm

Y Bai, D Qiang, Y Zhang, X Wang, X Zhuang, G Chen, Y Wang

Research output: Contribution to journalConference proceedings published in a journalpeer-review

Original languageEnglish
Number of pages0
Journal2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Volume0
Issue number0
DOIs
Publication statusPublished - 18 Oct 2020
Event2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) -
Duration: 18 Oct 202030 Oct 2020

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