Original language | English |
---|---|
Number of pages | 0 |
Journal | 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) |
Volume | 0 |
Issue number | 0 |
DOIs | |
Publication status | Published - 18 Oct 2020 |
Event | 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Duration: 18 Oct 2020 → 30 Oct 2020 |
Recognition of Nanocomposites Agglomeration in Scanning Electron Microscopy Image with Semantic Segmentation Algorithm
Y Bai, D Qiang, Y Zhang, X Wang, X Zhuang, G Chen, Y Wang
Research output: Contribution to journal › Conference proceedings published in a journal › peer-review