Magnetic force microscopy of recording heads

GP Heydon; WM Rainforth; MRJ Gibbs; HA Davies; JEL Bishop; JW Tucker; S Huo; G Pan; DJ Mapps; WW Clegg

Magnetic force microscopy of recording heads

GP Heydon, WM Rainforth, MRJ Gibbs, HA Davies, JEL Bishop, JW Tucker, S Huo, G Pan, DJ Mapps, WW Clegg

School of Engineering, Computing and Mathematics

Research output: Contribution to journal › Conference proceedings published in a journal › peer-review

Abstract

Imaging the magnetic domain structure of potential recording devices is necessary for the development of new products. Here we have used amorphous MFM tips to image the domain structure in a thin film etched to mimic a prototype recording head. Classic closure domain structures adjacent to the gaps, cut by focused ion beam milling, have been observed. Moreover a strain induced closure (SIC) domain pattern of pinned walls along the device edge, a result of imprecise ion milling in the photolithographic process, is present. For comparison, commercial crystalline CoCr MFM tips have also been used to image the thin film sample.

Original language	English
Pages (from-to)	331-334
Number of pages	0
Journal	Default journal
Volume	0
Issue number	161
Publication status	Published - 1999
Event	Electron Microscopy and Analysis 1999 - Duration: 1 Jan 1999 → …

Cite this

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title = "Magnetic force microscopy of recording heads",

abstract = "Imaging the magnetic domain structure of potential recording devices is necessary for the development of new products. Here we have used amorphous MFM tips to image the domain structure in a thin film etched to mimic a prototype recording head. Classic closure domain structures adjacent to the gaps, cut by focused ion beam milling, have been observed. Moreover a strain induced closure (SIC) domain pattern of pinned walls along the device edge, a result of imprecise ion milling in the photolithographic process, is present. For comparison, commercial crystalline CoCr MFM tips have also been used to image the thin film sample.",

author = "GP Heydon and WM Rainforth and MRJ Gibbs and HA Davies and JEL Bishop and JW Tucker and S Huo and G Pan and DJ Mapps and WW Clegg",

year = "1999",

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TY - JOUR

T1 - Magnetic force microscopy of recording heads

AU - Heydon, GP

AU - Rainforth, WM

AU - Gibbs, MRJ

AU - Davies, HA

AU - Bishop, JEL

AU - Tucker, JW

AU - Huo, S

AU - Pan, G

AU - Mapps, DJ

AU - Clegg, WW

PY - 1999

Y1 - 1999

N2 - Imaging the magnetic domain structure of potential recording devices is necessary for the development of new products. Here we have used amorphous MFM tips to image the domain structure in a thin film etched to mimic a prototype recording head. Classic closure domain structures adjacent to the gaps, cut by focused ion beam milling, have been observed. Moreover a strain induced closure (SIC) domain pattern of pinned walls along the device edge, a result of imprecise ion milling in the photolithographic process, is present. For comparison, commercial crystalline CoCr MFM tips have also been used to image the thin film sample.

AB - Imaging the magnetic domain structure of potential recording devices is necessary for the development of new products. Here we have used amorphous MFM tips to image the domain structure in a thin film etched to mimic a prototype recording head. Classic closure domain structures adjacent to the gaps, cut by focused ion beam milling, have been observed. Moreover a strain induced closure (SIC) domain pattern of pinned walls along the device edge, a result of imprecise ion milling in the photolithographic process, is present. For comparison, commercial crystalline CoCr MFM tips have also been used to image the thin film sample.

M3 - Conference proceedings published in a journal

SN - 0951-3248

VL - 0

SP - 331

EP - 334

JO - Default journal

JF - Default journal

IS - 161

T2 - Electron Microscopy and Analysis 1999

Y2 - 1 January 1999

ER -

Magnetic force microscopy of recording heads

Abstract

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