Guest Editorial: Characterisation of crack tip fields

MN James; L Susmel; F Iacoviello; Y Hong; EA Patterson; P Lopez-Crespo

doi:10.1016/j.ijfatigue.2014.04.002

Guest Editorial: Characterisation of crack tip fields

MN James
, L Susmel
, F Iacoviello
, Y Hong
, EA Patterson
, P Lopez-Crespo

School of Engineering, Computing and Mathematics

Research output: Contribution to journal › Article › peer-review

6 Downloads (Pure)

Original language	English
Pages (from-to)	1-2
Number of pages	0
Journal	International Journal of Fatigue
Volume	71
Issue number	0
DOIs	https://doi.org/10.1016/j.ijfatigue.2014.04.002
Publication status	Published - 2015

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10.1016/j.ijfatigue.2014.04.002

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title = "Guest Editorial: Characterisation of crack tip fields",

author = "MN James and L Susmel and F Iacoviello and Y Hong and EA Patterson and P Lopez-Crespo",

year = "2015",

doi = "10.1016/j.ijfatigue.2014.04.002",

language = "English",

volume = "71",

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journal = "International Journal of Fatigue",

issn = "0142-1123",

publisher = "Elsevier Ltd.",

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}

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T1 - Guest Editorial: Characterisation of crack tip fields

AU - James, MN

AU - Susmel, L

AU - Iacoviello, F

AU - Hong, Y

AU - Patterson, EA

AU - Lopez-Crespo, P

PY - 2015

Y1 - 2015

UR - https://pearl.plymouth.ac.uk/secam-research/825/

U2 - 10.1016/j.ijfatigue.2014.04.002

DO - 10.1016/j.ijfatigue.2014.04.002

M3 - Article

SN - 0142-1123

VL - 71

SP - 1

EP - 2

JO - International Journal of Fatigue

JF - International Journal of Fatigue

IS - 0

ER -

Guest Editorial: Characterisation of crack tip fields

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