Characterisation of MEMS devices using a polarisation interferometer

  • D Jenkins
  • , W Clegg
  • , XQ Liu
  • , E Fribourg-Blanc
  • , E Cattan
  • , D Remiens

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)91-99
Number of pages8
JournalIntegrated Ferroelectrics
Volume50
Issue number0
Publication statusPublished - 1 Jan 2002

Cite this