| Original language | English |
|---|---|
| Pages (from-to) | 91-99 |
| Number of pages | 8 |
| Journal | Integrated Ferroelectrics |
| Volume | 50 |
| Issue number | 0 |
| Publication status | Published - 1 Jan 2002 |
Characterisation of MEMS devices using a polarisation interferometer
- D Jenkins
- , W Clegg
- , XQ Liu
- , E Fribourg-Blanc
- , E Cattan
- , D Remiens
Research output: Contribution to journal › Article › peer-review