Original language | English |
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Pages (from-to) | 91-99 |
Number of pages | 8 |
Journal | Integrated Ferroelectrics |
Volume | 50 |
Issue number | 0 |
Publication status | Published - 1 Jan 2002 |
Characterisation of MEMS devices using a polarisation interferometer
D Jenkins, W Clegg, XQ Liu, E Fribourg-Blanc, E Cattan, D Remiens
Research output: Contribution to journal › Article › peer-review