Characterisation of crack tip fields—CCTF5
- Michael Vormwald*
- , Neil James
- , Youshi Hong
- , Luca Susmel
- , Francesco Iacoviello
*Corresponding author for this work
- Technische Universität Darmstadt
- Chinese Academy of Sciences
- University of Sheffield
- University of Cassino and Southern Lazio
Research output: Contribution to journal › Article › peer-review
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