| Original language | English |
|---|---|
| Pages (from-to) | 15-25 |
| Number of pages | 10 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Publication status | Published - 1 Jan 2001 |
A combined polarising interferometer and optical beam deflection system for MEMS characterisation
DFL Jenkins, WW Clegg, X Liu, G Tunstall, E Cattan, D Remiens, B Liu
Research output: Contribution to journal › Conference proceedings published in a journal › peer-review